基于UVM的Wishbone-SPI驗(yàn)證平臺(tái)設(shè)計(jì)
2022年電子技術(shù)應(yīng)用第6期
劉森態(tài),龐 宇,魏 東
重慶郵電大學(xué) 光電工程學(xué)院,重慶400065
摘要: 隨著芯片復(fù)雜度增加,芯片驗(yàn)證在設(shè)計(jì)流程中所消耗時(shí)間也不斷提高。針對傳統(tǒng)驗(yàn)證平臺(tái)重用性差、覆蓋率低,通過使用通用驗(yàn)證方法學(xué)(Universal Verification Methodology,UVM)設(shè)計(jì)Wishbone-SPI驗(yàn)證平臺(tái),用UVM組件靈活地搭建驗(yàn)證平臺(tái),完成標(biāo)準(zhǔn)的驗(yàn)證框架,設(shè)計(jì)受約束隨機(jī)激勵(lì),自動(dòng)統(tǒng)計(jì)功能覆蓋率。仿真結(jié)果顯示,該驗(yàn)證平臺(tái)功能覆蓋率達(dá)到100%,并表明該平臺(tái)具有良好的可配置性與可重用性。
中圖分類號(hào): TN402
文獻(xiàn)標(biāo)識(shí)碼: A
DOI:10.16157/j.issn.0258-7998.212337
中文引用格式: 劉森態(tài),龐宇,魏東. 基于UVM的Wishbone-SPI驗(yàn)證平臺(tái)設(shè)計(jì)[J].電子技術(shù)應(yīng)用,2022,48(6):36-41.
英文引用格式: Liu Sentai,Pang Yu,Wei Dong. Design of Wishbone-SPI verification platform based on UVM[J]. Application of Electronic Technique,2022,48(6):36-41.
文獻(xiàn)標(biāo)識(shí)碼: A
DOI:10.16157/j.issn.0258-7998.212337
中文引用格式: 劉森態(tài),龐宇,魏東. 基于UVM的Wishbone-SPI驗(yàn)證平臺(tái)設(shè)計(jì)[J].電子技術(shù)應(yīng)用,2022,48(6):36-41.
英文引用格式: Liu Sentai,Pang Yu,Wei Dong. Design of Wishbone-SPI verification platform based on UVM[J]. Application of Electronic Technique,2022,48(6):36-41.
Design of Wishbone-SPI verification platform based on UVM
Liu Sentai,Pang Yu,Wei Dong
Chongqing University of Posts and Telecommunications,Chongqing 400065,China
Abstract: As the complexity of the chip increases, the time it takes to verify the chip in the design process continues to increase. Aiming at the poor reusability and low coverage of traditional verification platforms, this paper uses Universal Verification Methodology(UVM) to design the Wishbone-SPI verification platform, uses UVM components to flexibly build the verification platform, completes the standard verification framework, and designs constrained random stimulus, automatically counting function coverage. The simulation results show that the functional coverage of the verification platform reaches 100%, and shows that the platform has good configurability and reusability.
Key words : UVM;SPI;Wishbone;verification platform
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